Scanning Electron Microscope (Phenom Model PROX by Thermo-Fisher) is technique used for microscopic analysis of surface of the material. SEM is equipped with BSD and EDX (for elemental analysis) detector with resolution up to nanometre level.
Optical Microscope (by Leica) is used to analyse the surface pattern of film & textile material.
We use the SEM & EDX to analyse the bulk structure of film & textile material, the surface properties of material such as size, shape and their chemical identity by elemental analysis. Optical microscope is used to analyse the surface of film & defects.
